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ZHN/SEM

Nanoindenter for scanning electron microscopes Download
Applications
  • Hardness testing to ISO 14577
  • Dynamic tests
Test load
  • 0 - 0.2 N
Applications
  • Research & development (in an SEM)

Small but mighty

The ZHN/SEM nanoindenter for installation in a scanning electron microscope (SEM) enables micromechanical experiments to be performed while observing the specimen at maximum resolution. It possesses the largest measuring range currently available, with a maximum displacement measurement of 200 µm and a maximum force of 200 mN, combined with very low-noise force and displacement sensors in a low-vibration environment. Instrument stiffness is so high that conventional hardness measurements can be performed without difficulty.

The standard system was developed for installation on the stage system of various SEMs, but can also be mounted on the chamber wall. The existing tilt and positioning options of the SEM stage can be used with this system.

The system consists of:

  • the measuring head with sensors and actuator
  • a piezo stage system for positioning specimens in the XY direction and optional rotation around the indenter axis
  • a stiff mechanical Z-stage for displacement of the measuring head towards the specimen
  • PC and controller
  • easy-to-use, highly flexible software
  • one or two flanges with feed-throughs (SEM-specific)

Advantages and features

  • Indenter can be tailored to customer requirements over a wide range.
  • Force and displacement control available as closed or open loop.
  • Dynamic measurement method with frequencies up to 100 Hz for fatigue and continuous stiffness measurements available as option.
  • An outstanding feature of the measuring head is that it can be used in the compression and tensile directions over the entire measuring range.
  • Video synchronization: the recorded image can be shown by transferring data to an additional window on the SEM computer via TCP/IP.

Technical overview

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Downloads

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  • Product information: ZHN/SEM – nanoindenter for scanning electron microscope PDF 1 MB

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